CAT stands for overvoltage category, a classification defined by IEC, used to measure the ability of measuring tools to withstand transient overvoltages (such as lightning strikes, switch surges) i...
How to reduce the ripple of BOOST boost circuit
2026-08-04
When debugging the BOOST boost circuit, it can be found that the output ripple is large, and excessive ripple not only causes voltage instability, interferes with precision analog circuits, causes ...
Relationship between vertical resolution and gear setting of oscilloscope
2026-06-30
In the actual waveform measurement process, selecting different vertical gears often results in different waveform peak values; If a vertical gear with a large range is selected, there will still b...
Three elements for measuring rise time
2026-06-26
In precise time-domain measurements, rise time is a key parameter, especially for high-speed digital signals. However, the observed rise time on the oscilloscope is not the true rise time of the si...
How to simply measure the amplitude at the -3dB point to determine bandwidth
2026-06-26
In electronic system testing and analysis, bandwidth is the core indicator for measuring the system's frequency response capability, and the amplitude -3dB point (half power point) is the industry'...
Analysis and Suppression Strategies of the Influence of Power Ripple on Signals in Precision Measuring Instruments
2026-05-14
Power ripple usually refers to the periodic AC component superimposed on the DC output, as well as random broadband noise. This article will delve into how power ripple degrades the accuracy and si...
The impact of impedance mismatch in output terminals
2026-05-06
In testing, the matching degree between the output impedance of the actual signal source and the terminal impedance directly determines the waveform quality of the reference signal, the authenticit...
Analysis of Overvoltage Damage in Vgs and Vds of PMOS Transistor in Off State
2026-05-06
PMOS is usually used in high-end switches, source connected to power supply, with a gate driving voltage that is relatively negative compared to the source, and operates in the off state with the h...
Analysis of the phenomenon of zero offset in high-voltage probes
2026-03-17
In scenarios such as high-voltage DC ripple measurement, a common phenomenon is encountered: when using the same high-voltage probe paired with different oscilloscopes or just different channels to...
Introduction to load effect of oscilloscope probe
2026-03-17
The presence of probes extends the application scope of oscilloscopes, enabling them to perform online testing and analysis of the electronic circuits under test.The selection and use of probes mus...